MIT.nano has added a new X-ray diffraction (XRD) instrument to its characterization toolset, enhancing facility users' ability to analyze materials at ...
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Semiconductor devices are becoming thinner and more complex, making thin deposited films even harder to measure and control. With 3nm node devices in production and 2nm nodes ramping toward ...
Diagram of an X-ray Reflectometry (XRR) setup: This schematic shows the arrangement of the X-ray tube, Gӧbel mirror, sample holder, and detector. The X-rays are emitted from the tube, shaped by slits ...
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