Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...

AFM is commonly used to characterize nanoparticles, which include valuable data related to their qualitative and quantitative properties. For instance, it provides information about the physical ...

A standard single frequency AFM is comprised of a boron-doped silicon (Si) or silicon nitride (Si 3 N 4) cantilever with a length of a few micrometers and a single crystal diamond tip at the bottom of ...

This handbook illustrates the wide variety of operating modes available on Bruker AFMs, going well beyond the standard high‑resolution topographic imaging capabilities of AFM. The modes are broken ...

In order to increase our understanding of structural dynamics of biomolecules at the single-molecule level, they would need to be captured at the sub-nanometer scale and in physiologically relevant ...

Atomic force microscopy (AFM) is a high-resolution imaging technique that generates 3D images of sample surfaces and characterizes their nanomechanical properties. AFM can be used for several ...

This article features newly announced Park FX40, a groundbreaking autonomous atomic force microscope, infused with innovative robotics, intelligent learning features, safety features, software and ...