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Seica Introduces Valid SL In-Circuit and Functional Test System

The VALID SL in-circuit and functional test system is designed for high-channel-count testing in demanding electronics manufacturing environments. Introduces a cable-free architecture with new ...
EDN

Combine in-circuit and functional component test advantages

Production test of a finished electronic product often involves two techniques: in-circuit test (ICT) and functional component test (FCT). The ICT technique examines a non-powered circuit board to ...
Electronic Design

Circuit Card Diagnostic and Test System Offers Component-Level Diagnostics

Astronics released its next-generation circuit card diagnostic and test system, the PinPoint 3-PXIe (P3-PXIe). Combining more than 30 years of development of the PinPoint Circuit Card diagnostic ...
Semiconductor Engineering

Doing More At Functional Test

SE: Why is applying functional test content so challenging today? Ruiz: There are a couple of different factors that make successfully applying functional patterns on the tester a challenge. In fact, ...