Wafer breakage is the most serious impact of killer crystalline defects. About 0.1 to 0.2% of silicon wafers break. The ...

Concrete structures like roads and bridges require nondestructive testing methods to identify interior defects without ...

The range of materials that concrete contains scatters normal sound waves, making clear imaging difficult to obtain.

Photo-induced force microscopy (PiFM) offers nanoscale defect characterization in semiconductors, combining chemical ...

The concept of zero defect manufacturing has been around for decades, arising first in the aerospace and defense industry. Since then, this manufacturing approach has been adopted by the automotive ...